Transactions of Nonferrous Metals Society of China The Chinese Journal of Nonferrous Metals

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中国有色金属学报

ZHONGGUO YOUSEJINSHU XUEBAO

第21卷    第6期    总第147期    2011年6月

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文章编号:1004-0609(2011)06-1485-06
嗜酸氧化亚铁硫杆菌表面双电层电势分布模拟
王兆慧1,谢学辉1,柳建设1, 2

(1. 东华大学 环境科学与工程学院,上海 201620;
2. 中南大学 资源加工与生物工程学院,长沙 410083
)

摘 要: 采用离子可透过模型和不可透过模型,通过数值拟合的方法计算嗜酸氧化亚铁硫杆菌的表面电荷密度、空间电荷密度、表面电位和道南电位等。Zeta电位测定结果表明:以硫为能源培养的细菌细胞等电点(IEP)高于报道的以亚铁培养的细菌的。运用表面基团离子化模型模拟实验数据得出:以硫培养的嗜酸氧化亚铁硫杆菌的   IEP>2,这主要是由细菌表面蛋白质的氨基电离引起的。采用离子可透过模型分析表明:pH<5时,细菌表面电位(φ0)和道南电位(φDON)下降较快;细菌表面的pH值等于细胞内的pH(约6~7)后,细菌的φ0和φDon的变化渐缓;计算得到细菌表面的双电层的厚度约为5 nm。细菌表面的双电层将影响浸矿体系中离子迁移和营养物质传输,而细菌彼此表面双电层的相互作用对细菌聚集不利。

 

关键字: 双电层;道南电位;离子可透过模型;软颗粒

Numerical modeling of potential profiles in electrical double layer of Acidithiobacillus ferrooxidans cell surface
WANG Zhao-hui1, XIE Xue-hui1, LIU Jian-she1, 2

1. College of Environmental Science and Engineering, Donghua University, Shanghai 201620, China;
2. School of Resources Processing and Bioengineering, Central South University, Changsha 410083, China

Abstract:The surface charge density, space charge density, surface potential (φ0) and Donnan potential (φDon) on the surface of Acidithiobacillus ferrooxidans cultivated with elemental sulfur (S-A.ferrooxidans) were calculated by numerical simulation using the ion-impenetrable and ion-penetrable models. Zeta potential measurement show that the isoelectric point (IEP) of S-A.ferrooxidans is higher than that of bacterium cultured with Fe2+. It is concluded from fitting data by ionizable surface group model that S-A.ferrooxidans surface probably consists of much proteins, the ionization of amino group of which causes higher IEP (>2). The ion-penetrable model reveals that φ0 and φDon decrease rapidly at pH<5 but hardly change when pH is 6−7. The thickness of electrical double layer of S-A.ferrooxidans is estimated as 5 nm. The electrical double layer of bacterial cell surface may have significant implications for ions transfer and nutrient transport, but their interaction is unfavorable for bacterial aggration.

 

Key words: electrical double layer; Donnan potential; ion-impenetrable model; soft particle

ISSN 1004-0609
CN 43-1238/TG
CODEN: ZYJXFK

ISSN 1003-6326
CN 43-1239/TG
CODEN: TNMCEW

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