Transactions of Nonferrous Metals Society of China The Chinese Journal of Nonferrous Metals

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中国有色金属学报

ZHONGGUO YOUSEJINSHU XUEBAO

第7卷    第1期    总第22期    1997年3月

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文章编号:(1997)01-169-3
热处理对硅片抗弯强度的影响
谢书银1   石志仪1   李冀东1   董 萍2

(1.中南工业大学应用物理及热能工程系;
2.测试分析中心,长沙 410083
)

摘 要:

 

关键字: 硅   抗弯强度    热处理

EFFECT OF HEAT TREATMENT ON FLEXURE STRENGTH OF SILICON WAFER
Xie Shuyin1, Shi Zhiyi1, Li Jidong1, Dong Ping2

1.Department of Applied Physics and Heat Engineering,
2.Central South University of Technology, Changsha 410083

Abstract:The effects of heat treatment temperature, time and cooling way on the flexure strength of ACZ and NCZ silicon wafers with various contents of oxygen and nitrogen were studied. The strength of silicon wafer was increased by the formation of silicon-oxygen and nitrogen-silicon-oxygen complexes and was decreased by the formation of silicon-oxygen and nitrogen-silicon-oxygen precipitates. A new two step cooling technique eliminating heat donor and preventing the decrease of strength was suggested.

 

Key words: silicon    flexure strength    heat treatment

ISSN 1004-0609
CN 43-1238/TG
CODEN: ZYJXFK

ISSN 1003-6326
CN 43-1239/TG
CODEN: TNMCEW

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