(1.北京有色金属研究总院， 北京 100088；
2.北京工业大学 材料科学与工程学院，北京 100022；
3.中南大学 材料科学与工程系， 长沙 410083)
摘 要: 根据氢氧化镍电极材料的X射线衍射谱线的各向异性宽化特性，提出层错结构表征方法。采用层错宽化效应的Warren法和Langford谱分解法，测算了一些镍电极材料的层错率。结果发现层错率与材料的放电容量存在对应关系，放电容量较高(270mA·h/g)的材料层错率达14.9%，而放电容量较低(207mA·h/g)的材料层错率为7.6%。因此可以用层错率表征氢氧化镍电极材料的电化学性能。
关键词: 氢氧化镍；电极材料；层错率；放电容量
stacking faults for nickel hydroxide
（1.General Research Institute for Nonferrous Metals,
Beijing 100088, China;
2.School of Materials Science and Engineering,
Beijing Polytechnic University, Beijing 100022, China;
3.Department of Materials Science and Engineering,
Central South University, Changsha 410083, China）
Abstract:According to the anisotropic broadening feature in X-ray diffraction pattern of Ni(OH)2 electrode materials, the stacking fault structural model is proposed. By using the methods suggested from both of Warren and Langford, the stacking fault probability of so me nickel hydroxides were determined. Compared with the data of discharge capacity of the material, it is found that there exists a certainly corresponding relationship, e.g. the greater the discharge capacity (270mA·h/g), the higher the stacking fault probability (14.9%) is an d the smaller the discharge capacity (207mA·h/g), the lower the stacking fault probability (7.6%) is. The structural characterization of electrochemical property was suggested by using stacking fault ratio.
Key words: nickel hydroxide; electrode material; stacking fault; discharge capacity
