(厦门金鹭特种合金有限公司 技术研究与发展中心,
厦门 361006)
摘 要: 用X射线衍射研究粒度10.86~0.124μm系列WC粉末的粒度效应。随粒度变小,衍射线线形发生明显变化,从敏锐到极其漫散。亚微 米级粒度的WC粉末谱线半高宽随粒度变细显著变化,半高宽是度量粒度效应的主要指标,而对于微米级粒度的粒度效应则可应用谱线背底宽度来衡量。极细和超细粒度WC粉末衍射谱线的2θ位置明显偏离平衡位置, 这与临近纳米粒度有关。WC粉末衍射强度也随粒度产生明显变化,衍射强度随粒度变细的变化规律与半高宽的规律呈反转对应关系。应用WC粉末X射线衍射的粒度效应,尤其是谱线宽化的规律作为评定亚微米级WC粉末粒度尤其是极细和超细粒度,是有应用前景的。
关键字: WC粉末;粒度;粒度效应;X射线衍射;谱线宽化
(R&D Centre, Xiamen Golden Egret Special Alloy Co., Ltd,
Xiamen 361006, China)
Abstract:Effects of WC powder particle sizes from 1 0.86 to 0.124μm were investigated by X-ray diffraction. With the size fined, X-ray diffraction spectra change as follows: X-ray diffraction profiles evidently vary from sharp to diffuse, spectral line broadening, intensity changing, and diffraction peak (2θ) removed.
Key words: WC powder; particle size; effect of particle size; X-ray diffraction; line broadening