中国有色金属学报(英文版)
Transactions of Nonferrous Metals Society of China
| Vol. 6 No. 3 September 1996 |
TEM STUDIES FOR DIGM IN Kr ION IRRADIATED Au-Cu BILAYERS
（General Research Institute for Nonferrous Metals, Beijing100088
* Argonne National Laboratory, IL60439, U. S. A.）
Abstract:Cross-section transmission electron microscopy (TEM) was used to study diffusion induced grain boundary migration (DIGM) in Kr ion irradiated and annealed Au-Cu bilayers. Using this technique, in combination with small probe X-ray energy dispersive spectroscopy, DIGM alloyed zones in Au were identified in an irradiated sample.
Key words: grain boundary migration electron microscopy Kr ion
