X-RAY POWDER DIFFRACTION DATA AND STRUCTURE REFINEMENT OF COMPOUND ErNi2Si2|Yan Jialin Ou Xiangli and Zeng Lingmin Hao Jianmin-《中国有色金属学报》官方网站|全网首发|论文开放获取

您目前所在的位置：首页 - 期刊简介 - 详细页面

中国有色金属学报(英文版)

Transactions of Nonferrous Metals Society of China

Vol. 8 No. 4 December 1998

X-RAY POWDER DIFFRACTION DATA AND STRUCTURE REFINEMENT OF COMPOUND ErNi₂Si₂

Yan Jialin¹ Ou Xiangli¹ and Zeng Lingmin¹ Hao Jianmin²

（1.Institute of Materials Science, Guangxi University, Nanning530004, P. R. China
2.Tianjin Electronic Materials Research Institute, Tianjin 300192, P. R. China）

Abstract:The X-ray powder diffraction data for ErNi₂Si₂are given and the crystal structure has been refined by the Rietveld whole-pattern-fitting method. The compound ErNi₂Si₂crystallizes with the ThCr₂Si₂ type structure (tetragonal, space group I4/mmm,Z=2). The refined lattice parameters area=3.9321(1),c=9.5237(1) and the structure was refined toR_p=13.09%,R_wp=16.69%. The figure of meritFN for the powder data isF₃₀=108.2 ( 0.0063,44 ).

Key words: ErNi₂Si₂　X-ray powder diffraction　Rietveld structure refinement

ISSN 1004-0609
CN 43-1238/TG
CODEN: ZYJXFK

ISSN 1003-6326
CN 43-1239/TG
CODEN: TNMCEW