中国有色金属学报(英文版)
Transactions of Nonferrous Metals Society of China
| Vol. 19 Special 3 December 2009 |
（1. Electronic Materials Research Laboratory, Key Laboratory of Education Ministry,
Xi’an Jiaotong University, Xi’an 710049, China;
2. State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi’an 710072, China）
Abstract:The thermal expansion behavior of mercury indium telluride (MIT) crystals, Hg(3−3x)In2xTe3(x=0.5), based on X-ray diffraction experimental data is studied at 298−573 K. The variation of the lattice parameter of MIT crystals with temperature was determined and the thermal expansion coefficient was deduced to be 6.18×10−6 K−1. The results of the thermal expansion are fitted to polynomial expressions. It is found that the lattice parameter decreases quickly with temperature increasing at 298−330 K and then increases continuously up to 573 K. The minimum lattice parameter corresponds to a maximum shrinkage of 0.06%.
Key words: mercury indium telluride; crystal growth; XRD; thermal expansion; semiconductor material
