Transactions of Nonferrous Metals Society of China The Chinese Journal of Nonferrous Metals

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中国有色金属学报(英文版)

Transactions of Nonferrous Metals Society of China

Vol. 19    Special 1    September 2009

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Voltage-induced material removal mechanism of copper for electrochemical-mechanical polishing applications
Sang-Jun HAN1, Yong-Jin SEO2

1. Nano-Information Material & Device Laboratory, Daebul University, Chonnam, 526-702, Korea;
2. School of Fusion Technology, Daebul University, Chonnam, 526-702, Korea

Abstract:The current—voltage (IV) curves, such as linear sweep voltammetry (LSV) and cyclic voltammetry (CV), were employed to evaluate the effect of electrolyte concentration on the electrochemical reaction trend. From the IV curve, the electrochemical states of active, passive, transient and trans-passive region could be characterized. And then, the mechanism of the process of voltage-induced material removal in electrochemical mechanical polishing (ECMP) of copper was investigated. Scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) analyses were used to observe the surface profile. Finally, the oxidation and reduction processes of the Cu surface were monitored by the repetition of anodic and cathodic potential from cyclic voltammetry (CV) method in acid- and alkali-based electrolyte.

 

Key words: electrochemical mechanical polishing; linear sweep voltammetry; cyclic voltammetry; HNO3; KNO3; electrolyte

ISSN 1004-0609
CN 43-1238/TG
CODEN: ZYJXFK

ISSN 1003-6326
CN 43-1239/TG
CODEN: TNMCEW

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