Transactions of Nonferrous Metals Society of China The Chinese Journal of Nonferrous Metals

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中国有色金属学报(英文版)

Transactions of Nonferrous Metals Society of China

Vol. 15    No. 2    April 2005

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Critical misfit of epitaxial growth metallic 
thin films
LI Jian-Chen(李建忱), LIU Wei(刘 伟), JIANG Qing(蒋 青)

Key Laboratory of Automobile Materials, Ministry of Education;
Department of Materials Science and Engineering, Jilin University, 
Changchun 130025, China

Abstract: The critical misfit of epitaxial growth metallic thin films fc was thermodynamically considered. It is found that there exists a competition between the energy of the misfit dislocation of film and non-coherent interface energy of film-substrate. Equilibrium between these energies was present at a critical atomic misfit fc. When the atomic misfit is larger than the critical value, epitaxial growth does not occur. The critical misfit of the epitaxial growth thin films can be predicted. The results show that fc is proportional to the non-coherent interface energy of the film-substrate, and inversely proportional to the elastic modulus and the thickness of the film.

 

Key words: epitaxial growth film; atomic misfit; dislocation; interface energy

ISSN 1004-0609
CN 43-1238/TG
CODEN: ZYJXFK

ISSN 1003-6326
CN 43-1239/TG
CODEN: TNMCEW

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